This program is meant to simulate the diffraction patterns of single or multi-layered carbon nanotube.

Created by Jeremy Low, if you have any questions regarding the program please contact me at jlow692@live.unc.edu 
or Professor Lu-Chang Qin at lcqin@unc.edu

Program Features:

- Chiral Indices u and v:  	Determine the helicity of the carbon nanotube.  If simulating a multilayered
				nanotube please input the chiral indices starting with the largest radius
				for best results.

- New Image:	Creates a new image which only displays the currently input chiral indices.

- New Layer:	Used for simulating multilayer nanotubes.  Will overlay the diffraction pattern of the current
		chiral indices over the old image.

- Contrast Min:	Input a value between 0 and 1.  Any intensities below this value are automatically set to zero.
		Does not work retroactively when adding new layers.

- Contrast Max:	Input a value between 0 and 1.  Any intensities avove this value are automatically set to one.
		Does not work retroactively when adding new layers.

- Contrast Coefficient:	All intensity values are multiplied by this value.  The maximium displayed intensity is
		still one.  Does not work retroactively when adding new layers.

- Save:	Saves the currently displayed image as a png.  The file will automatically be titled 
		DiffractionPattern[u1,v1],[u2,v2]... where u1,v1 are the first input chiral indices and so on.
	
- Invert:	Inverts the displayed image when saving.  Used to save ink if the image is being printed.

- Random Noise:	The program automatically generates random noise when creating a new image.  This is to
		realistically reflect the noise seen in real diffraction patterns.

Released on 09/08/2017