W.M. Keck Laboratory for Atomic Imaging and Manipulation
Transmission Electron Microscope JEM 2010F-FasTEM
Accelerating Voltage | 200 kV |
Point Resolution (TEM) | 0.23 nm |
Lattice Resolution (TEM) | 0.10 nm |
Point Resolution (STEM) | 0.23 nm |
Lattice Resolution (STEM) | |
Spherical Aberration Coef. | 1.0 mm |
Minimum Focusing Step | 1.4 nm |
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