W.M. Keck Laboratory for Atomic Imaging and Manipulation
Transmission Electron Microscope JEM 2010F-FasTEM
| Accelerating Voltage | 200 kV |
| Point Resolution (TEM) | 0.23 nm |
| Lattice Resolution (TEM) | 0.10 nm |
| Point Resolution (STEM) | 0.23 nm |
| Lattice Resolution (STEM) | |
| Spherical Aberration Coef. | 1.0 mm |
| Minimum Focusing Step | 1.4 nm |